Precision spring-loaded semiconductor test pins designed for reliable performance in demanding testing applications.
Key Product Features
Ultra-Fine Precision: 0.11 mm plunger and 0.15 mm barrel for micro-pitch PCB pads, IC leads, flex circuits, and semiconductor testing
High Conductivity Gold Plating: Gold-plated plunger and barrel ensure low contact resistance and stable signal transmission
Multiple Tip Styles: Available in B tip (60° cone), U tip, D tip, and fully customized geometries
Durable Spring Structure: Stainless steel spring (SUS material) provides stable working stroke and reliable contact force
Custom Manufacturing: OEM/ODM accepted with fast delivery from our factory
Production Specifications
Product Images
Detailed Component Illustration
Comparison of different test probe tip types and configurations
Customization Options
SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD. offers comprehensive customization for our brass barrel stainless steel spring test probes:
Custom diameters to match your specific requirements
Custom plating thicknesses for optimal conductivity and durability
Custom mechanical specifications tailored to your application
All products include material traceability documentation and certificate of analysis for quality assurance. Contact us to request samples or a quotation for your specific application requirements.
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