Outer Diameter 2.03 MM gold-plated testing needle with SK4 telescopic spring for ICT applications. Model: GKS-003 Pitch.
Product Specifications
Test Probe Selection Guide
Test probes are available from many manufacturers with similar constraints. When selecting a test probe receptacle, the tip choice is the most critical consideration.
Detailed illustration of test probe components and construction
Various test probe tip types
Customization Options
At SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD., we offer comprehensive customization:
Custom diameters to match your specific requirements
Custom plating thicknesses for optimal conductivity and durability
Custom mechanical specifications tailored to your application
All products include material traceability documentation and certificate of analysis for quality assurance.
Contact us to request samples or a quotation for your specific application requirements.
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